Patent · US Expired

Arrangement for testing fuses

US4710720A · kind A · utility

4Cited by
2References
10Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 24, 1985
Grant dateDec 1, 1987
Priority date
Expiry dateJul 24, 2005

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01H2085/0216
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A circuit for testing fuses, especially those of the so-called "little fuse" type, is accommodated in the housing of an electrical component which belongs to a central current distribution system, especially to a central electric system of a vehicle. A simple test arrangement for such fuses is created therewith, whereby this arrangement can be manufactured in a simple and cost-favorable manner and requires no additional space.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.