Contact assembly for distance measuring gauge
US4718169A · kind A · utility
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7References
7Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 15, 1986 |
| Grant date | Jan 12, 1988 |
| Priority date | — |
| Expiry date | Dec 15, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B3/002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A first measuring contact is displaced along a gauge distance measuring axis to measure the distance to a second reference contact. Both contacts pivot about axes that lie on the gauge measuring axis and on the respective contact surfaces. When the contacts abut, the pivot axes are coextensive. Both contacts can engage a contoured wall regardless its angle to the gauge measuring axis and accurately measure the wall thickness along the gauge measuring axis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.