Patent · US Expired

Contact assembly for distance measuring gauge

US4718169A · kind A · utility

0Cited by
7References
7Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 15, 1986
Grant dateJan 12, 1988
Priority date
Expiry dateDec 15, 2006

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B3/002
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A first measuring contact is displaced along a gauge distance measuring axis to measure the distance to a second reference contact. Both contacts pivot about axes that lie on the gauge measuring axis and on the respective contact surfaces. When the contacts abut, the pivot axes are coextensive. Both contacts can engage a contoured wall regardless its angle to the gauge measuring axis and accurately measure the wall thickness along the gauge measuring axis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.