Patent · US Expired

Method and apparaus for centrally collecting measured values

US4720806A · kind A · utility

59Cited by
7References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 29, 1985
Grant dateJan 19, 1988
Priority date
Expiry dateMar 29, 2005

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB65H2701/31
  • WIPO fieldHandling
  • WIPO sectorMechanical engineering

Abstract

A method and apparatus to centrally collect measured values of a variable parameter from each of a plurality of work stations, and so as to facilitate quality control. Each work stations includes a sensor for generating an output signal which is a function of the variable parameter, and the output signal is converted to digital signals, which represent discrete increments within the measuring range of the variable parameter. The digital signals are stored during a predetermined period of time in a memory unit so as to be available for periodic scanning by the central computer, after which the stored signals are cleared so that the memory unit is free to record the values during the next period of time. Also, circuitry is provided whereby only the extreme values of the output signalsd ar stored, together with the mean value, which are adequate to provide a complete statement of the quality of the process and product being monitored.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.