Patent · US Expired

Method of determining circularity and mean radius of closed curved surface

US4729174A · kind A · utility

14Cited by
4References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 15, 1986
Grant dateMar 8, 1988
Priority date
Expiry dateJul 15, 2006

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B7/293
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A device (gage, data station, and software) and method to measure mean radius and deviations from mean radius of nominally cylindrical or conical shapes in a plane perpendicular to the nominal axis of revolution using curvature measurements at uniformly spaced intervals about the circumference is described. The system divides the contour of interest into equal segments and measures the local curvature at each point. The group of measurements combines with a closure constraint to produce a condition of mathematical overcompleteness. This is used to minimize the accumulation of measurement error.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.