X-ray examination apparatus
US4731807A · kind A · utility
35Cited by
4References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 29, 1986 |
| Grant date | Mar 15, 1988 |
| Priority date | — |
| Expiry date | Sep 29, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K1/10
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
The present invention concerns an X-ray examination apparatus allowing to produce images of an object through the scanning of the object by at least two fan-shaped beams having different energy spectra, and obtained from a single X-ray source, thereby allowing to obtain simultaneously images of the object adapted to contain different informations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.