Magnetic thickness gauge with third support
US4733178A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Oct 1, 1985 |
| Grant date | Mar 22, 1988 |
| Priority date | — |
| Expiry date | Oct 1, 2005 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB82Y15/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A magnetic thickness gauge is disclosed wherein a balance arm is pivotally mounted in a housing with a spring providing a bias force to counteract a magnetic attraction of the balance arm toward a base of a coating to be measured. The balance arm is provided with a probe assembly including a magnet selectively positionable with respect to a spherical contact member of either a particular alloy of aluminum, iron and silicon or of tungsten carbide. The housing is preferably provided with supports at either end of the gauge. A balance arm is moved by way of a protrusion provided between the probe assembly and an adjustment knob for the spring with a scale and pointer indicating the thickness of the coating to be measured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.