Analog computing method of solving a second order differential equation
US4734879A · kind A · utility
7Cited by
8References
13Claims
0Family size
Inventors
Key dates
| Filing date | Sep 24, 1985 |
| Grant date | Mar 29, 1988 |
| Priority date | — |
| Expiry date | Sep 24, 2005 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06G7/38
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of measuring the depletion layer width and electric field of a semiconductor junction or barrier with a particular impurity distribution profile in the semiconductor. With analog computation technique, a time-varying signal is used to simulate the impurity profile. Automatic generation of the constants of integration for the solution of Poisson's differential equation is achieved by adjusting pulse repetition rate or by iterative bisection method.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.