Device for measuring the contour of a surface along a scanning line
US4736208A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Dec 10, 1986 |
| Grant date | Apr 5, 1988 |
| Priority date | — |
| Expiry date | Dec 10, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for measuring the contour of a surface along a scanning line. The device includes an electro-mechanical transducer with a scanner arm on whose free end there is a sensing tip. The other end of the arm is connected, via a pivot bearing whose axis of rotation is parallel to the surface to be scanned and vertical to the scanning line, with an advance mechanism. The advance mechanism moves the pivot bearing along the scanning line. The transducer emits, corresponding to excursions of the sensing tip transverse to the scanning line, a measurement signal that is fed into a recording device. The recording device records the electrical signal on the basis of distance or time. A control device is provided into which the electrical measurement signal is fed. On the basis of the magnitude of the electrical measurement signal, the control device produces an advance or a lag of the advance mechanism or of the time axis of the recording device relative to the advance of the advance mechanism. The advance or lag is in a degree and a direction that correspond to the movement of the scanning point in the advance direction relative to its pivot bearing in the case of excursions essentially …
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.