Patent · US Expired

Telescoping pin probe

US4739259A · kind A · utility

102Cited by
8References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 1, 1986
Grant dateApr 19, 1988
Priority date
Expiry dateAug 1, 2006

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01R11/18
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A probe for use in electrical circuit test equipment, in which a contact element is longitudinally slidable in an insulator sleeve which also contains an R-C attenuator circuit connected electrically to the contact element by an electrically conductive elastomeric material. A high impedance cable is connected electrically to the other end of the RC attenuator circuit by another piece of conductive elastomeric material. The cable connects the attenuator to another R-C circuit which, together with the attenuator, forms a voltage divider, and the attenuated signal controls an amplifier which provides a signal through a low impedance cable to a test equipment.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.