Patent · US Expired

Optical measuring apparatus

US4740081A · kind A · utility

29Cited by

2References

8Claims

0Family size

Assignee

U.S. Philips Corporation · US

Inventors

Gerhard Martens · Henstedt-Ulzburg, DE
Thomas Helzel · Kaltenkirchen, DE

Key dates

Filing date	Mar 18, 1986
Grant date	Apr 26, 1988
Priority date	—
Expiry date	Mar 18, 2006

Classification

Technology area (CPC G)Physics
CPC primaryG01D5/344
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An optical sensor (1) is connected to an electro-optical transducer unit (35) and a measuring circuit (36) via an optical delay line (14) and an optical path (15). Error-free measurement values which are independent of the attenuation characteristics of the optical delay line (14) are obtained if the optical sensor (1) comprises a polarization splitter (3) which receives light pulses from the optical path (15) and from the optical delay line (14) and which is followed by a sensor body (2) which is traversed by the light pulses. A mirror (4) arranged on the side of the sensor body (2) on which the light is not incident reflects the light pulses back into the polarization splitter (3), which couples the light pulses back into the optical path (15) and the optical delay line (14).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.