Controlled impedance microcircuit probe
US4740746A · kind A · utility
60Cited by
5References
4Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 24, 1987 |
| Grant date | Apr 26, 1988 |
| Priority date | — |
| Expiry date | Feb 24, 2007 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01R13/2421
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A probe for coupling electrical test equipment to a selected point of an electrical device has a resiliently supported rigid pin for contacting the selected point and a wave guide of substantially constant characteristic impedance coupling the test equipment to the pin.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.