Patent · US Expired

Method of fabricating a charge coupled device

US4742027A · kind A · utility

15Cited by
12References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 17, 1987
Grant dateMay 3, 1988
Priority date
Expiry dateFeb 17, 2007

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F39/15

Abstract

A gate structure for integrated circuits and more especially for photosensitive charge-transfer devices comprises elements of the gate-insulator-semiconductor type. The gate structure is constituted by a thin film-layer of transparent or semi-transparent conductive material covered with a layer of compatible insulating material having a refractive index higher than 1.5.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.