Patent · US Expired

Testing apparatus for intrusion detectors

US4743886A · kind A · utility

18Cited by
8References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 23, 1985
Grant dateMay 10, 1988
Priority date
Expiry dateSep 23, 2005

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG08B29/14
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

The monitoring of intrusion detectors is effected by an apparatus for testing the responsiveness to environment-caused, detector-specific useful and spurious signals. This testing apparatus is arranged inside of the intrusion detector and ensures that during installation and during the operation of the intrusion detector its electrical parameters are optimally adjusted. Deviations of these parameters from their nominal values and the location of these deviations are indicated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.