Processing of oriented patterns
US4745550A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 16, 1985 |
| Grant date | May 17, 1988 |
| Priority date | — |
| Expiry date | Aug 16, 2005 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V2210/40
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed are a method and a system for processing patterns such as oriented patterns, to derive constituents which are more useful than the original patterns. For example, an oriented pattern such as a seismic section can be decomposed into a flow field, which is an estimate of a moving accretion boundary which formed the subsurface layers, and a residual pattern, which is an estimate of layer properties, such as acoustic velocity. Similarly, an oriented pattern such as a chart displaying changes in borehole resistivity with depth along its vertical direction and changes in resistivity with angle around the borehole along its horizontal dimension, can be decomposed into a flow field and a residual pattern, where the flow field is an estimate of a moving accretion boundary and the residual pattern is an estimate of resistivity changes with depth and angle independent of the accretion boundary. The flow field can be mapped onto regular, e.g. orthogonal or polar, coordinates to thereby straighten the original pattern into a deformed or residual pattern which is more useful with respect to visualizing or further processing a parameter of interest than the original pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.