Patent · US Expired

Dimension-measuring probe with a pivoted probing arm

US4748747A · kind A · utility

1Cited by
2References
8Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 12, 1987
Grant dateJun 7, 1988
Priority date
Expiry dateJan 12, 2007

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B5/02
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A dimension-measuring probe for fine measurements having a probe lever pivoted between its ends to provide an indicator arm and a sensing arm on opposite sides of the pivot. The sensing arm terminates in a pivot point. Spring means separate from the probe lever is provided next to the probe lever and connects to the probe point. The spring means serves to urge the probe point into contact with a work piece being measured. This structure eliminates stress on the sensing arm which tends to bend the arm and cause errors in measurement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.