Methods of and apparatus for measuring the frequency response of optical detectors
US4749277A · kind A · utility
5Cited by
1References
12Claims
0Family size
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Key dates
| Filing date | Jan 20, 1987 |
| Grant date | Jun 7, 1988 |
| Priority date | — |
| Expiry date | Jan 20, 2007 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/0622
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods of and apparatus for measuring the frequency response of optical detectors based on interferometrically demodulating a frequency modulated semiconductor laser. Detectors can be characterized where the 3 dB roll-off frequency is in excess of 100 GHz, is self-calibrating by simplified and inexpensive techniques.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.