Patent · US Expired

Automatic sampling apparatus

US4757437A · kind A · utility

42Cited by
4References
4Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 9, 1986
Grant dateJul 12, 1988
Priority date
Expiry dateJul 9, 2006

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N35/1095
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An automatic sampling apparatus for individually obtaining samples from a plurality of receptacles in a rectangular array, includes a sample table for supporting a rack containing the array of receptacles, and a sampling device movable in two dimensions above said sample table and receptacles. Further, a control device is provided for receiving positional data from the sampling device in a teaching mode representing the two-dimensional position of the sampling device above the sample table, and for calculating the pitch spacing between receptacles in a single row, and row spacing between adjacent rows of receptacles, wherein the pitch spacing is calculated by arithmetic division of the length of one row by the number of receptacles in a row minus one, and the row spacing is calculated by arithmetic division of the distance between farthest rows by the number of rows minus one. Additionally, the control device is provided for controlling the sample device to individually obtain samples in a stepping manner from the receptacles based on the calculated pitch and row spacings. An operation panel, operatively coupled with the control device, has input keys to position the sampling devic…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.