Electrical test probe
US4758177A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Feb 11, 1987 |
| Grant date | Jul 19, 1988 |
| Priority date | — |
| Expiry date | Feb 11, 2007 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01R13/6276
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The test probe has a tubular body member with a fixed sleeve secured to its front end such that an annular space is formed between the tubular body member and the fixed sleeve rearward of the forward portion of the test probe. A plurality of forward apertures are formed through the fixed sleeve in a plane transverse to the axis of the tubular body member and a plurality of rearward apertures are formed through the fixed sleeve in a second plane transverse to the axis of the tubular body member. A slideable sleeve is located around the tubular body member and is adapted to be moved to rearward and forward positions in the annular space relative to the tubular body member. Centering balls are located partially in the forward apertures and partially in the annular space and latching balls are located partially in the rearward apertures and partially in the annular space. The moveable sleeve may be moved forward to initially move the centering balls outward through their apertures and then to move the latching balls outward through their apertures to center the probe in an opening of an apparatus having a reduced entrance and then to latch the probe in the opening apparatus. After test…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.