Method of measuring mask misregistry in kinescope panel assemblies
US4758728A · kind A · utility
6Cited by
5References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 24, 1985 |
| Grant date | Jul 19, 1988 |
| Priority date | — |
| Expiry date | Dec 24, 2005 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J9/42
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The misregistration of kinescope panel assemblies is measured by passing UV through the shadow mask to the phosphor screen. The lighthouse optics are set for exposure of one of the three phosphor colors, such as green. The intensity of light emanating from the panel is measured for a plurality of locations on the screen, and for a plurality of incremental positions of the panel assembly with respect to the lighthouse light source. The position of maximum intensity of light emanating from the panel is recorded and used to calculate the misregistration between the phosphor screen and the shadow mask.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.