Method for examining the surface reliefs of a sample and apparatus for carrying out same
US4758730A · kind A · utility
13Cited by
5References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 22, 1986 |
| Grant date | Jul 19, 1988 |
| Priority date | — |
| Expiry date | Oct 22, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention concerns a method for examining a sample whose surface comprises reliefs, and an apparatus for carrying out the method. The apparatus comprises a sample carrier plate subjected to illumination from at least two sources having different wavelengths and whose illumination axes form an acute angle of incidence on the sample carrier plate, the illumination axes of the sources being all different, and an observation system for the sample carried by the plate. The method may be used for measuring the effectiveness of a cosmetic treatment product on a skin.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.