Patent · US Expired

Method and apparatus for inspecting printed circuit board

US4758782A · kind A · utility

38Cited by
3References
5Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 10, 1986
Grant dateJul 19, 1988
Priority date
Expiry dateSep 10, 2006

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/95638
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Method and apparatus for inspecting a printed circuit board wherein scanned image data are digitized and analyzed according to a feature extraction method and a mutual comparison method. The result of both of the analysis methods is combined with predetermined conditions to control output devices including a CRT display or a marking device. The two complementary methods compensate each others drawbacks so that the reliability of inspection can be improved.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.