Mass spectrometer
US4760253A · kind A · utility
20Cited by
0References
6Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 29, 1987 |
| Grant date | Jul 26, 1988 |
| Priority date | — |
| Expiry date | Jan 29, 2007 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05H1/30
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The invention provides a mass spectrometer adapted for the elemental analysis of a sample in which ions are formed from the sample in an inductively coupled plasma (ICP). The flame of the plasma (14) is directed against the front surface (30) of a cone (19), and ions are sampled from the plasma through a hole (16) in the apex of the cone. In order to reduce the intensity of the background mass spectra, the rear surface (32) of the inside of the cone is polished to a surface finish of 5 microns or better, at least in the vicinity of the hole.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.