System for analyzing laser beam profiles
US4760537A · kind A · utility
8Cited by
5References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 29, 1985 |
| Grant date | Jul 26, 1988 |
| Priority date | — |
| Expiry date | Nov 29, 2005 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S3/0014
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A two-dimensional image and energy profile of the output from a pulsed laser is analyzed on a pulse-by-pulse basis by a video graphics image processing system coupled to a minicomputer. An intensity distribution in psuedo color for the full beam is formed by the processor and displayed on a color monitor in real time. The minicomputer performs analytical measurements in two dimensions on the beam shape and size as well as on the pulse timing properties of the laser. The system serves as a real time diagnostic tool for laser development.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.