Patent · US Expired

IC card having fault checking function

US4760575A · kind A · utility

23Cited by
5References
4Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 3, 1986
Grant dateJul 26, 1988
Priority date
Expiry dateJun 3, 2006

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/24
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Disclosed is an IC card having a fault check function comprising a ROM having test areas of the number corresponding to memory address lines so that predetermined various data necessary for executing a fault check are recorded in advance into the test areas, means for successively reading out the data previously recorded in the test areas, means for detecting coincidence of the respective data successively read out by the reading-out means with corresponding ones of said predetermined data previously recorded n the test areas, and means for making judgement as to whether a fault exists or not on the basis of a result of detection by the coincidence detecting means.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.