Patent · US Expired

Method for validating the value of a parameter

US4761748A · kind A · utility

120Cited by
5References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 13, 1985
Grant dateAug 2, 1988
Priority date
Expiry dateSep 13, 2005

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01D1/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The method according to the invention consists of sampling, at successive times separated by constant or non-constant time intervals, signals supplied by redundant channels measuring or calculating the parameter and validating a value of said parameter, as a function of a sample of N values of each channel, in which N.gtoreq.2. In a preferred manner, each sample of N values is modeled by a straight line using the method of least squares and the validated value of the parameter is worked out as a function of the inter-coherent models.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.