Self-testing monitoring circuit
US4762663A · kind A · utility
14Cited by
4References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 8, 1986 |
| Grant date | Aug 9, 1988 |
| Priority date | — |
| Expiry date | Apr 8, 2006 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01H47/002
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A self-testing contact closure test circuit and method in which invalid logic states are artificially created in order to simulate a switch malfunction, and thus to determine whether the testing circuitry correctly identifies the invalid state. The system is designed to be used with switches such as those incorporating form "C" arrangements having two pairs of contacts which under normal circumstances are in opposite states.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.