Method for aligning the axis of a second bracket relative to the axis of a first bracket on a testing or processing machine

US4764010A · kind A · utility

Assignee

• Deutsche Forschungs- und Versuchsanstalt fur Luft- und Raumfahrt e.V. · DE

Inventors

• Volker Bachmann · Eriskirch, DE
• Hubert Doker · Bonn, DE

Key dates

• Filing date: Aug 26, 1986
• Grant date: Aug 16, 1988
• Expiry date: Aug 26, 2006

Classification

• Technology area (CPC Y): Emerging Cross-Sectional Technologies
• CPC primary: Y10S33/21
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

On a testing or processing machine the axis of a second bracket is to be ctly aligned relative to the axis of a first bracket. For this purpose a laser is mounted on the first bracket which directs a beam onto the reflector surface of a disc mounted on the second bracket. The reflected beam produces a dot of light on the perforated disc, which is arranged about the exit aperture of the light source. By adjusting the second bracket the dot of light is directed onto the aperture. Once this is done the two brackets are in exact alignment. To align brackets arranged at an angle to each other a beam deflecting device can be arranged in the path of the beam. All the auxiliary devices needed for measurement can likewise be exactly adjusted in accordance with the method.