Patent · US Expired

Test fixture for electronic device packages

US4767983A · kind A · utility

5Cited by
5References
10Claims
0Family size

Inventor

Key dates

Filing dateJan 5, 1987
Grant dateAug 30, 1988
Priority date—
Expiry dateJan 5, 2007

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/0433
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Disclosed is a test fixture for connecting a plurality of electronic device packages to test apparatus. The fixture includes a plurality of test sockets and means to selectively interconnect the socket leads with external test apparatus. The test fixture may be used as a burn-in board as well as a test, transport and storage medium to reduce individual handling of electronic device packages.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.