Six-port reflectometer test arrangement
US4769592A · kind A · utility
5Cited by
0References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 31, 1986 |
| Grant date | Sep 6, 1988 |
| Priority date | — |
| Expiry date | Dec 31, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test arrangement for testing high frequency electrical devices consists of two 6-port reflectometers which are both connected to a device under test. As well as being applied to the device under test, a reference sample of an excitation signal is routed to both 6-port reflectometers simultaneously. The test arrangement is capable of very wide operation and is able to fully characterize the electrical properties of a device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.