Patent · US Expired

Approximation system

US4774685A · kind A · utility

13Cited by
7References
17Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 31, 1985
Grant dateSep 27, 1988
Priority date
Expiry dateJan 31, 2005

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F17/17
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A system for generating a continuous piece-wise linear approximating function that approximately corresponds to a predetermined function over a preselected domain, the approximating function having a selected number of linear segments, the approximating function at the endpoints of the domain falling on the predetermined function. The system first selects an initial error limit, then identifies the points which define the segments. In defining the segments, the system begins at a low endpoint, extends a test segment from the low point to a high endpoint on the predetermined function, and then tests the error between the test segment and the predetermined function at each point. If the error is less than the error limit, the system selects a new higher point on the predetermined function as the new high endpoint, and repeats the operation until the test segment error between it and the predetermined function by at most the error limit. The system then extends the test segment until the error is, at most, the error limit. After determining all but the last segment, the system tests the last segment to determine whether each point is within the selected error of the approximating func…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.