Electronic device test method and apparatus
US4775640A · kind A · utility
30Cited by
6References
15Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 1, 1987 |
| Grant date | Oct 4, 1988 |
| Priority date | — |
| Expiry date | May 1, 2007 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S359/90
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for automatically testing LEDs formed in a wafer (11) includes a computer (15), a test probe (21) for applying a bias to an individual LED and a sensor probe (32) for positioning the test probe with respect to a contact (57) on the LED. Light from the LED is transmitted by an optical fiber (22) to opto-electronic equipment (18) for analysis and characterization by the computer (15). LED bias is provided by a pulse generator (35) and faulty diodes are marked by a marker probe (31). Each LED contains a lens portion (60) for directing LED light to the optical fiber (22).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.