Patent · US Expired

Thickness measuring apparatus for sheet material

US4777729A · kind A · utility

10Cited by

5References

14Claims

0Family size

Assignee

GAO Gesellschaft für Automation und organisation mbH · DE

Inventor

August Häusler · Wolfratshausen, DE

Key dates

Filing date	Dec 18, 1986
Grant date	Oct 18, 1988
Priority date	—
Expiry date	Dec 18, 2006

Classification

Technology area (CPC G)Physics
CPC primaryG07D7/183
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A thickness measuring apparatus for sheet material has before the actual measuring gap a pretest sensing element which responds to overthicknesses in the material under test transported to the apparatus and, if necessary, swivels the measuring system out of the plane of transport. This avoids jamming in the transport system and damage to or maladjustment of the measuring system. A triggering mechanism which cooperates with the pretest sensing element can be designed in such a way that the measuring system is swiveled away only in the case of a definite adjustable force. After a disturbance the measuring system is automatically returned to the original position.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.