Noncontact measuring device for cylindrical, elongated objects bent into three-dimensional shapes
US4778274A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Nov 13, 1986 |
| Grant date | Oct 18, 1988 |
| Priority date | — |
| Expiry date | Nov 13, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/007
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A noncontact measuring device has a generally L-shaped pivotable and rotatable probe means to be disposed along a straight portion of an object. Another noncontact measuring device has a rotatable probe means with an inverted L-shape to be disposed along a straight portion of an object. The probe of the former device projects a beam of light, while that of the latter device projects two beams of light. For either measuring device, when the beam or beams of light are being intercepted by the object, coordinates of a predetermined point of the probe means are read by a three-dimensional shape measuring apparatus to which the device is connected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.