System for calibrating a monochromator
US4779216A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Mar 7, 1986 |
| Grant date | Oct 18, 1988 |
| Priority date | — |
| Expiry date | Mar 7, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/2866
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for calibrating a monochromator to compensate for mechanical imperfections in its diffraction grating and grating drive assembly employs a two stage interactive procedure which permits the use of small (0.2 nm) spectral regions for the identification of emission lines. An iterative, self-consistent, discrete Fourier transform is used for the determination of multiple positioning correction terms. When the Fourier calculations are completed, the results of the calibration procedure are presented by the system to the analyst for acceptance. If accepted, the positioning error of the primary calibration line is measured, stored and used by the system to maintain a zero centered distribution of positioning errors each time the monochromator is reinitialized.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.