Testable variable-threshold non-volatile semiconductor memory
US4779272A · kind A · utility
78Cited by
5References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 27, 1986 |
| Grant date | Oct 18, 1988 |
| Priority date | — |
| Expiry date | Oct 27, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5006
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A variable-threshold non-volatile memory in which a potential falling between a selection and a non-selection level is applied to the gates and the resultant drain current is measured to determine if one of the transistors has an abnormal threshold voltage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.