Crystal for an X-ray analysis apparatus
US4780899A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 15, 1986 |
| Grant date | Oct 25, 1988 |
| Priority date | — |
| Expiry date | Apr 15, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K2201/067
- WIPO fieldEngines, pumps, turbines
- WIPO sectorMechanical engineering
Abstract
A crystal for an X-ray analysis apparatus is mounted on a carrier of an amorphous material whose bonding surface preferably obtains its desired geometry by grinding and polishing. Using a suitably transparent carrier, use can be made of a UV-curable type of adhesive which is irradiated through the carrier. The thickness of the layer of glue can be checked, if desired, via the same path. Because no disturbing background radiation is generated by an amorphous carrier, local irregularities are avoided, and better thermal adaptation of carrier and crystal material is feasible, such a crystal will contribute to a substantially higher resolution when used in an X-ray analysis apparatus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.