Method for producing a standard pattern for pattern matching
US4783831A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 19, 1985 |
| Grant date | Nov 8, 1988 |
| Priority date | — |
| Expiry date | Sep 19, 2005 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F18/28
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
This invention provides a method and apparatus for automatically producing a standard pattern for local pattern matching. According to the present invention, local patterns equivalent in size to a standard pattern to be obtained are successively removed from the image of an object being examined to prepare standard pattern candidates. Evaluation values representing appropriateness as a standard pattern are obtained from the local patterns successively removed or the local patterns together with the image of the object being examined. The evaluation values are used in an evaluation function expressing the uniqueness of the standard pattern and in an auxiliary evaluation function as an aid to the former. The standard pattern is selected using such evaluation values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.