Infrared trace element detection system
US4785184A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 27, 1986 |
| Grant date | Nov 15, 1988 |
| Priority date | — |
| Expiry date | May 27, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/354
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An infrared trace element detection system including an optical cell into which the sample fluid to be examined is introduced and removed. Also introduced into the optical cell is a sample beam of infrared radiation in a first wavelength band which is significantly absorbed by the trace element and a second wavelength band which is not significantly absorbed by the trace element for passage through the optical cell through the sample fluid. The output intensities of the sample beam of radiation are selectively detected in the first and second wavelength bands. The intensities of a reference beam of the radiation are similarly detected in the first and second wavelength bands. The sensed output intensity of the sample beam in one of the first and second wavelength bands is normalized with respect to the other and similarly, the intensity of the reference beam of radiation in one of the first and second wavelength bands is normalized with respect to the other. The normalized sample beam intensity and normalized reference beam intensity are then compared to provide a signal from which the amount of trace element in the sample fluid can be determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.