Patent · US Expired

Process and apparatus for determination of dimensions of an elongated test object

US4785193A · kind A · utility

7Cited by

7References

6Claims

0Family size

Assignee

OEM Messtechnik GmbH · DE

Inventors

Hans-Ulrich Dassler · Oberschleißheim, DE
Rudiger Haas · Altenkirchen, DE
Gerhard Loffler · Walldorf, DE

Key dates

Filing date	Jun 13, 1986
Grant date	Nov 15, 1988
Priority date	—
Expiry date	Jun 13, 2006

Classification

Technology area (CPC G)Physics
CPC primaryG01B11/08
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An opto-electronic measuring bench for the automatic dimensional inspection of externally turned parts, where the test object is linearly illuminated and an image of two diametrically opposed contour points produced on two rows of photodiodes. The diameter of the shafts may be determined from the position of the images of the two contour points recognized as intensity jumps and the electrically determined distance of the two rows of diodes. The rows of diodes may be moved together with the light sources in the axial direction of the test object, in order to carry out diameter measurements over the entire axial length of the test object. The distance of the diode rows in the axial direction from a starting position is also determined electrically, so that length measurements of the test object are also possible.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.