Device for monitoring characteristics of a film on a substrate
US4785336A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 4, 1986 |
| Grant date | Nov 15, 1988 |
| Priority date | — |
| Expiry date | Dec 4, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8427
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for determining and displaying selected characteristics of a film formed on the surface of a glass ribbon includes a scanning head mounted on a track for movement above the filmed surface of the glass ribbon. The scanning head has a source of light pulses generated from a tungsten lamp and chopper, filtered to simulate daylight and focused on the filmed surface. An integrating sphere is also mounted on the scanning head and has an entrance port formed in a wall thereof for collecting a portion of the light being reflected from the surface. Optically filtered detectors mounted in detector ports formed in the wall of the sphere generate output signals representing the "Y" and "Z" components of the collected light on the CIE X,Y,Z, tristimulus scale. A programmed microprocessor is responsive to the detector signals and information concerning the position of the scanning head with respect to the surface of the glass ribbon for generating visual displays of selected characteristics such as reflectivity, b* on the CIELAB tristimulus scale and overcoat thickness as a function of the position at which the light beam is reflected from the filmed surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.