Method for determining formation characteristics with enhanced vertical resolution
US4786796A · kind A · utility
9Cited by
2References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 3, 1986 |
| Grant date | Nov 22, 1988 |
| Priority date | — |
| Expiry date | Oct 3, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V5/107
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining a characteristic of a subsurface geological formation enhances the vertical resolution of dual-detector measurements by utilizing a continuous calibration factor which is obtained from an environmentally compensated characteristic derived from at least two resolution-matched sensor signals, and from a resolution-matched sensor signal from the near-detector of the tool.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.