Patent · US Expired

Logic gate system design

US4791578A · kind A · utility

19Cited by
7References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 30, 1986
Grant dateDec 13, 1988
Priority date
Expiry dateDec 30, 2006

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/33
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for evaluating the testability of circuit systems containing a plurality of logic gates through evaluating statistical properties in response to selected inputs.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.