Automatic optical inspection system
US4794647A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 8, 1985 |
| Grant date | Dec 27, 1988 |
| Priority date | — |
| Expiry date | Apr 8, 2005 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30141
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An automatic optical inspection system, for inspecting printed circuit boards and the like, employs so-called dimensional verification and pattern recognition techniques simultaneously. The printed circuit board is scanned by means of a CCD camera to produce a binarized image of the board. The image is stored and access provided to a set of picture elements arranged in a generally circular configuration and which are spaced apart by a dimension to be monitored by dimensional verification (DV) means. Access is also provided to a second set of picture elements arranged in a generally rectangular array of picture elements for the pattern recognition (PR) means, which uses template matching to determine their validity. The DV and PR outputs are weighted and clustered before a fault is signalled.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.