Patent · US Expired

Nondestructive method for analyzing total porosity of thin sections

US4797906A · kind A · utility

13Cited by
2References
6Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 28, 1987
Grant dateJan 10, 1989
Priority date
Expiry dateSep 28, 2007

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N15/088
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Total porosity of impregnated thin sections can be measured using X-ray fluorescence. The technique requires an impregnating fluid which contains an element not contained in more than trace quantities by the rock. By measuring the intensity of fluorescence generated by bombarding the impregnated thin section with sufficiently energetic X-rays and rationing that intensity to the intensity of fluorescence generated by subjecting a sample containing only epoxy to the same conditions, and scaling the resulting measures of fluorescence, a measure of total effective porosity is produced.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.