Method and apparatus for non-contacting identification of the temperature distribution in an examination subject

US4798209A · kind A · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Klaus Klingenbeck · Aufseß, DE
• Rudolf Schittenhelm · Erlangen, DE

Key dates

• Filing date: Jan 9, 1987
• Grant date: Jan 17, 1989
• Expiry date: Jan 9, 2007

Classification

• Technology area (CPC A): Human Necessities
• CPC primary: A61B18/1815
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method and apparatus for undertaking a non-contacting measurement of the three-dimensional temperature distribution in a non-uniform examination subject direct microwave radiation at the examination subject, detect the three-dimensional phase and amplitude of microwave radiation which is attenuated and scattered by the examination subject, and calculate the three-dimensional dielectric constant distribution in the examination subject on the bases of the detected phase and amplitude values. In a separate step the characteristic thermal radiation of object is measured, too. The three-dimensional temperature distribution of the examination subject is then calculated from both the three-dimensional dielectric constant distribution data and the characteristic thermal readiation data of a selected location.