Patent · US Expired

Multiple set point condition monitoring systems

US4799174A · kind A · utility

11Cited by
12References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 23, 1987
Grant dateJan 17, 1989
Priority date
Expiry dateOct 23, 2007

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01F23/802
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A multiple set point material condition monitoring system includes a material responsive sensor developing a material condition dependent admittance and a reference admittance generator, generating a plurality of different admittance values in a predetermined sequence repeatedly during operation of the system. The circuitry coupled with the sensor and the reference admittance generator outputs a signal which is a function both of the material condition generated admittance and each of the plurality of reference admittance values, in sequence. Storage means are provided for storing a characteristic of the output signal for feedback to the circuitry when that particular reference admittance value for generating that output signal is again generated by the reference admittance generator. Preferably, the sensor and reference admittance generator are coupled across each of a pair of arms of bridge network which constitutes part of the circuitry developing the output signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.