X-ray inspection system
US4803639A · kind A · utility
Assignee
Inventors
- Douglas S. Steele
- Larry C. Howington
- James W. Schuler
- Joseph J. Sostarich
- Charles R. Wojciechowski
- Theodore W. Sippel
- Joseph Manuel Portaz
- Ralph Gerald Isaacs
- Henry J. Scudder, III
- Thomas G. Kincaid
- Kristina Helena Valborg Hedengren
- Rudolph Alfred Albert Koegl
- John P. Keaveney
- Joseph Czechowski, III
- John Robert Brehm
- James M. Brown, Jr.
- David Oliver
- George Williams
- Richard D. Miller
Key dates
| Filing date | Feb 25, 1986 |
| Grant date | Feb 7, 1989 |
| Priority date | — |
| Expiry date | Feb 25, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray inspection system for manually or automatically performing digital fluoroscopy inspections and/or computed tomography inspections by X-ray examination of manufactured parts incorporates a computer system which automatically analyzes the inspected parts for flaws. The system includes apparatus for automatically positioning the parts in an X-ray machine for obtaining fluoroscopy and tomography views of the part and for acquiring data from the inspections at production rates. The system automatically identifies the location of rejectable flaws in the parts during the fluoroscopy scanning and subsequently identifies those locations for obtaining tomography scans, if the identified flaw location is questionable. The system can automatically reject parts containing flaws identified during the fluoroscopy inspections. This system operates in a real-time environment by providing analysis of one part while a subsequent part is being subjected to X-ray examination. The data obtained during each examination is archived and stored for tracking the part in further manufacturing processes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.