Patent · US Expired

Six-port reflectometer test arrangement and method including calibration

US4808912A · kind A · utility

17Cited by
0References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 31, 1986
Grant dateFeb 28, 1989
Priority date
Expiry dateDec 31, 2006

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R27/06
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test arrangement for testing high frequency electrical devices consisting of two 6-port reflectometers which are both connected to a device under test. In order to calibrate the test arrangement, an arbitrary termination generator is connected to each test port while its test signal represents a reflectivity coefficient of greater than unity, so that it simulates active devices as well as passive ones.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.