Method of aligning a linear array X-ray detector
US4809314A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 25, 1986 |
| Grant date | Feb 28, 1989 |
| Priority date | — |
| Expiry date | Feb 25, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B15/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray inspection system includes an X-ray source for generating a directed X-ray beam and a linear array detector for measuring the intensity of the received radiation and generating electrical signals representative thereof. A method for aligning the detector with the directed X-ray beam includes removing any part between the X-ray source and the detector, opening an X-ray beam limiter, positioning the linear array detector for maximum signal from each detector element, reducing the X-ray beam limiter opening, detecting whether any signal from a detector element is reduced, moving the limiter for producing a maximum signal on each signal, securing the X-ray beam limiter, and positioning the detector array for maximum signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.