System for improved flaw detection in polycrystalline diamond
US4810447A · kind A · utility
6Cited by
8References
10Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 4, 1985 |
| Grant date | Mar 7, 1989 |
| Priority date | — |
| Expiry date | Feb 4, 2005 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB01J2203/0685
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is an improvement enabling a more reliable detection of flaws in polycrystalline diamond compacts by x-ray imaging and especially for compacts used for wire drawing dies. In an embodiment, wire die compacts are prepared having a polycrystalline diamond core disposed within a metal carbide annulus. In the core are uniformly dispersed less than five (5) percent by weight particles such as tungsten carbide which initially have an average particle size substantially less than the diamond particles used to form the polycrystalline mass.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.